When every micrometer counts: AT expands its high-performance XCS series with 5 GigE

Measuring details as small as a single red blood cell? Not a problem for the new C7 XCS 3070 by AT – Automation Technology. This high-performance sensor brings extreme precision to inline quality control—compact, lightning-fast, and now equipped with a 5 GigE interface.

Watch the video to see how this sensor takes inspection in the semiconductor, electronics, and advanced packaging industries to the next level!

The Top 3 Benefits at a Glance:

• Cell-Level Precision: An X-resolution of 7.8 µm and a Z-resolution of 0.13 µm make even the smallest microstructures visible.
• 5 Gbit/s High-Speed Data: Thanks to the NBASE-T interface, profile data, intensity, and reflection info are transmitted simultaneously and in real-time.
• Ultra-Thin Laser Line: The highly homogeneous 405 nm laser line guarantees consistently precise measurement results across the entire field of view.

For Time-Critical Applications: Also available as a WARP variant featuring on-sensor data processing and profile rates up to 94 kHz!