Planarity Check with the C7 CA Series

What makes our new C7 3D camera a must-have in the semiconductor industry? It’s clear: 5 times more data throughput at 5 gigabits/s and a resolution of 3072 pixels per profile – ideal for inspecting the smallest components in the micrometer range.

Whether substrate flatness or demanding material and reflection properties – the C7 delivers precise results at high throughput. Thanks to direct LaserLink connection and 5G Ethernet, it can also be easily integrated into existing processes.