Compact Sensor Series: The Benchmark for BGA Planarity Inspection

Experience the perfect blend of high-speed performance and industrial precision with the Compact Sensor (CS) Series from AT. Engineered specifically to tackle the challenges of BGA planarity checks, this series offers a tailor-made solution for semiconductor quality control.

By integrating a custom-designed housing, the CS Series effectively eliminates measurement artifacts, providing clean, actionable data even on complex surfaces. With a generous 180x180mm Field of View (FoV) and a blazing scan rate of 98,000 profiles/s, you can ensure every solder ball is perfectly aligned without sacrificing production speed.